OPENING KEYNOTE

OPENING KEYNOTE

Mr Jochen den Ouden

 

 

 ABSTRACT

Hack Complete. Exams for Sale!
What We Can Learn From Internet Criminals, Hackers and the Dark Web.

In today’s ever-changing, digital society, cybercrime is a threat that can no longer be ignored. Hackers and other cyber criminals love getting their hands on our data, which they can then sell on the dark web to the highest bidder.

Unfortunately, these days it is no different with exams. Exam fraud is something that has been going on for years, meaning sometimes candidates are not getting the results they deserve.

Jochen den Ouden describes candidates doing everything they can to commit different types of exam fraud, some of which turn out to be barely detectable. But other forms of exam fraud also occur, for example by disrupting the integrity of an exam digitally.

In his keynote, he elaborates on how cybercrime today can affect exam fraud. He looks at the digital world, how it creates challenges in terms of security, and how this all relates to the examinations landscape.

BIO

As an IT Security Specialist, Jochen den Ouden believes that information security is only possible in an interplay between people, technology and the organization. 

 

These three chains are inextricably linked. In daily life he gives advice on IT Security processes for profit and non-profit organizations. He does this by using ethical hacks (security testing) to see where there are potential leaks in software, hardware and people. In addition, he makes employees of an organization aware of the real dangers on the web and he trains IT people to become Certified Ethical Hackers.

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CLOSING KEYNOTE

CLOSING KEYNOTE

Mr Wim J van der Linden

 

 

ABSTRACT

A Brief History of Statistical Detection of Test Security Breaches

Wim J. van der Linden

It may look as if the use of statistics to detect test security breaches is something recent. But the first attempts were already made in the 1920s, not coincidentally the time when large-scale testing and multiple-choice items were introduced. In hindsight, its nearly one-century-old tradition can be viewed as a long development from rather intuitively motivated summaries of test data used to “prove cheating” to the more modest model-based approaches introduced over the last decade. In this presentation, I reflect on important landmarks along this historical trajectory and speculate about the developments we may see in the near future.

BIO

Wim J van der Linden is a Professor Emeritus of Measurement and Data Analysis, University of Twente, The Netherlands and a former Distinguished Scientist and Director of Research and Innovation, Pacific Metrics Corporation, Monterey, CA

He received his PhD in psychometrics from the University of Amsterdam. His research interests include test theory, computerized adaptive testing, optimal test assembly, test equating, modeling response times on test items, as well as decision theory and its application to problems of educational decision making.

He is the author of Linear Models for Optimal Test Design published by Springer in 2005 and the editor of a new three-volume Handbook of Item Response Theory: Models, Statistical Tools, and Applications published by Chapman & Hall/CRC in 2016-2018.  He is also a co-editor of Computerized Adaptive Testing: Theory and Applications (Boston: Kluwer, 2000; with C. A. W. Glas), and its sequel Elements of Adaptive Testing (New York Springer, 2010; with C. A. W. Glas).

Wim van der Linden has served on the editorial boards of nearly all major test-theory journals and is co-editor for the Chapman & Hal//CRC Series on Statistics for Social and Behavioral Sciences.  He is a former President of both the National Council on Measurement in Education (NCME) and the Psychometric Society, Fellow of the Center for Advanced Study in the Behavioral Sciences, Stanford, CA, was awarded an Honorary Doctorate from Umea University in Sweden in 2008, and is a recipient of the ATP, NCME and Psychometric Society Career Achievement Awards for his work on educational measurement.

 

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